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OpTaliX Version History

Obsolete Versions 6.xx

Versions 7.xx
Version 6.98
New Features:

  • Importing lenses from vendor catalogs now offers options to filter the lens catalogs on parameters like EFL and diameter.
  • Biocular analysis for optical systems that are viewed with two eyes simultaneously.
  • New macro options:
    • The INPUT statement prompts the user for numeric data or text data during execution of the macro.
    • A WHILE-ENDWHILE loop control allows execution of a loop until a specific condition is true.
  • New lens database items (LDI):
    • IND returns the refractive index of glasses.
    • ABBE returns the dispersion value (Abbe number) of glasses.
  • Zernike coefficients are now available as variables in optimization.
  • Accuracy of diffraction MTF calculation improved for small ray grids (NRD 8 or NRD 16).

Bug Fixes:

  • Aspheric deviation analysis (ASD, ASD2) could not plot surface shape of user defined surface (UDS).
  • Illumination analysis produced inconsistent results. This occured only in zoom/multi-configuration systems.

Version 6.94/6.95
New Features:

  • An option to export PSF data to ASCII or EXCEL files has been added to the PSF dialog.
  • Calculation of the wavelength and order dependent diffraction efficiency on diffractive surfaces (gratings, holograms) is now supported.
  • OSLO import now recognizes decentered surfaces, multiple apertures and decentered/rotated apertures.

Bug Fixes:

  • Inconsistent patch values in PSF-3D and PSF-XY plots corrected.
  • In macro "IF" conditions, the "equal" operand (==) was not correctly parsed.
  • Coatings attached to surfaces: If a coating file contained material pickups, refractive indices of layers were not correctly updated.
  • Coating refinement/optimization: Layers including material dispersion are now correctly handled.
  • Tolerance sensitivity analysis did not account for tilt and decenter tolerances if the surface was globally referenced.
  • Inverting surfaces did not correctly handle some array parameters (AMX, AMY, AADE, ABDE, ACDE) which resulted in an incorrect ray trace after the inversion.
  • Tolerance analysis: Changes made to a system due to tolerances were not completely inversed (restored) after the tolerance run. This effect only occured if compensators have been defined in an optimization setup, and did not affect simple thickness or defocus compensators.
  • Zooming wavelength (WL command) did not correctly update index of refraction on surfaces with material links (i.e. when material properies were copied from another surface).
  • Rays defined in ray source files are now correctly transformed to other coordinates/angles. Previously, the Z-coordinate was not correctly interpreted.

Version 6.92
Maintenance Update:

  • DMD command corrected.
  • Windows that are minimized are now resized to "normal" size when selected from the tree view window. Previously, windows were activated but stayed minimized.
  • In FIE analysis, plot of distortion could fail. Now corrected.
  • The program ignored MFR/MFRF settings (spatial frequency for MTF-plots vs. frequency respectively field).

Version 6.90
New Features:

  • A FORMAT option has been added to the PRINT command. This allows formatted output of numerical data and text and is particularly useful in loop environments (DO-ENDDO) where tabulated data is preferred.
  • The ECE (encircled energy) command has been modified and expanded. In addition, a new command EQE has been added for ensquared energy.
  • An import option for Optilayer thin-film coatings has been added. This allows to read coating designs in the native Optilayer format (*.ods).
  • The ray aiming procedure has been enhanced such that all wavelengths used in a system are now taken into account. Previously, ray aiming was performed only at the reference wavelength.
  • Numerical data obtained from photorealistic ghost analysis can now be saved to ASCII files and to Microsoft Excel directly.

Bug Fixes:

  • Export of data to Excel could fail in case of large arrays of data. This interface now works reliably.
  • Two-point holograms on mirror surfaces could lead to incorrect ray trace results. This did not affect two-point holograms used in transmission or other hologram types.

Version 6.86
New Features:

  • The Chinese glass catalogue (CDGM) now includes equivalent glasses.
  • New Schott glasses added: P-SF8, N-SF2, N-KZFS5.
  • Output of optical path difference (OPD, OPDW) is now given relative to the chief ray which appears to be more practicable. Previously, OPD/OPDW were given in absolute units.
  • Tolerances that are defined but not used (i.e. not checked in the tolerance editor) are now saved with the optical design data. This allows re-activation of tolerances at a later stage without the need to enter tolerances again.
  • Exporting graphics to the formats WMF, PNG, SVG, BMP, PCX is now also supported from the command line and in macros. Previously this was only possible from the graphical user interface (GUI). See the command GRA for more information.
  • Two new commands have been added to control the bitmap size of graphics exported to the clipboard or to files: BMPX, BMPY.
  • Conrady's D-d method for correcting chromatic spherical aberration is now implemented. The DMD command has been added to support this option.

Bug Fixes:

  • In environment analysis, aspheric coefficients are now correctly scaled with temperature.
  • Corrected distortion calculation if the object space is filled with a material other than air.
  • Restoring optical systems containing lens modules could cause incorrect rendering of fields.
  • Objects at infinity are now defined for object distances >1.E10 mm (previously >1E20) to improve numerical stability.
  • Default constraints in optimization, in particular MNA (axial thickness), MNE (edge thickness), could lead to premature termination of optimization if improper surface heights were set.
  • Radial energy (RAD) now correctly takes square or rectangular image patches into account. Previously, only circular image areas were calculated, irrespectively of the patch definition.
  • Uninitialized parameters in macros are now assumed zero and the macro is continued. Previously, the macro was aborted under such conditions. The behaviour is now consistent with the manual description.

Version 6.80
New Features:

  • Schott glasses added: LITHOSIL-Q, FK5HT, BK7HT, LLF1HT, LLF6HT, LF5HT
  • New command IMG added. This command allows re-definition of the image surface number. It is particularly useful in systems which require two (or more) image planes. An example would be analyzing/optimizing for optimum performance at an intermediate image AND at the final image simultaneously.

Bug Fixes:

  • In macros, missing parameters are now assumed zero as described in the reference manual. Previously, an error message was issued and the macro was terminated.

Version 6.77/6.79
(19-Aug-2007, 9-Sept-2007)
New Features:

  • Plot of aspheric deformations improved. The ASD command has been enhanced to allow specification of reference radius and radial sampling.
  • New command IFR added which allows definition of increment in (spatial) frequency used in MTF calculations.

Bug Fixes:

  • Import of interferometric deformations could crash if interferograms of different sizes were simulatenously used in a system.
  • Incorrect error messages were issued on zooming wavelengths or glasses. Even though this did not affect validity of calculations, it was annoying due to excessive error messages.
  • Variables used inside of a lens database item (LDI) were incorrectly interpreted under special conditions and lead to premature termination of a macro.
  • Cylinder surfaces in non-sequential environments were incorrectly traced under extreme conditions. Notice that this did not affect cylinder surfaces in sequential ray trace.
  • Incorrect report of NAO in FIR command.
  • In illumination plots, cross sections in false colour plot were reversed.
  • Minor improvements on the command line parser.
  • Incorrect reporting of MTFA (average MTF) corrected. Note that this ONLY concerned numeric output but not MTF calculation (version 6.79).

Version 6.74
New Features:

  • Bitmap images of grid PSF can now written to BMP, PCX or PNG files. In addition, field coordinates can be displayed on each grid PSF. In case of systems with intermediate image(s), bitmap image display can be inverted to allow correct rendering of PSF's.
  • Interferograms attached to a surface now display the surface aperture overlayed to the surface deformation. This allows a more precise control of the measured interferogram dimensions in relation to the aperture of a surface.
  • An omni-directional ray aiming mode has been added. Rays can be launched at a full +/- 180° angular range which covers the full 4p sphere.

Bug Fixes:

  • Inverse tolerance analysis could crash in absence of tolerance criteria.
  • In systems using aspheric surfaces the PATH command returned incorrect results.

Version 6.72
Maintenance Update:

  • Personal settings of the main tree view window are now memorized between different program sessions. Previously, a predefined window width was always set at program start.
  • Improved window handling: Size and position of windows and dialogs are now more correctly restored between sessions, respectively on closing and re-opening a window or dialog.
Version 6.70
New Features:

  • OpTaliX has been successfully tested on the newly released Windows VistaTM. In particular, when upgrading to Vista make sure you are using the latest Hardlock (dongle) driver.
  • The user interface has been substantially reworked. Windows are now easily accessible by a hierarchical tree view. The second command line is now floating and can be placed anywhere on the screen.
  • In the macro editor, a separate input field has been added for passing parameters to the macro script. Previously, parameters could only be passed via the command line.
  • Exporting graphics to AutoCad DXF now writes "polylines". Previously separated line segments were written which made editing of the drawing in third-party programs cumbersome.

Bug Fixes:

  • Cylinder surfaces were not correctly recognized in BEA (Gaussian beam analysis).

Version 6.68
New Features:

  • Both absolute and relative DNDT values are now listed (see LIS DNDT command).
  • Local surface coordinate axes can be plotted in lens layout plots.
  • Grid distortion plot has been amended with numerical distortion data. In addition, grid distortion can now calculated on the basis of chief ray, spot gravity center and PSF gravity center.
  • Transmission analysis vs. surface has been enhanced: It is now possible to analyze transmission averaged over the full pupil for each surface individually. Previously, only chief-ray transmission was considered.

Bug Fixes:

  • In zoom systems, default constraints on THI (thickness) were ignored.
  • Code V export: Private glass coefficients were exported in the wrong format.
  • In extended image analysis (EIMD), width of a Gaussian source is now correctly defined by 1/e2 INTENSITY. Previously, 1/e2 AMPLITDUE was assumed which caused confusion.
  • Zemax import and export: Combined tilts on a single surface are now correctly interpreted. Previously, tilt about Y-axis was converted with wrong sign.
  • Ray aiming of wide angle systems (e.g. Fish-Eye systems) is now much more stable. Previously, ray aiming could fail at very wide field angles. This improvement is also accompanied by a small speed improvement.

Version 6.65
New Features:

  • New parameters for tolerance sensitivity have been added to optimize for 'as-built' performance. This is a new feature. See commands TSA to TSZ.
  • Optimization now terminates if a certain limit on ray errors is exceeded. The stopping criterion can be adjusted in the optimization parameters section or by the new OERR command.
  • Glass catalogues from SCHOTT, OHARA and HOYA have been reworked and new glasses added.
  • Melt frequency and relative price information have been added to the SCHOTT, OHARA and HOYA catalogs. This information is listed by the commands LIS GLA and LIS ALG.
  • Export to Code V now also supports fictitious glasses.
  • Import of Macleod coating files has been reworked to account for newer versions of the Macleod coating design file format.
  • Glasses with index- and dispersion-offsets (DNO, DVO) are now indicated by red colour in the surface editor and by an additional asterix in the surface listing.

Bug Fixes:

  • In CAM-calculations, the stepping increment now may also be negative. Previously, CAM-calculation stopped prematurely with negative increments.

Version 6.62
New Features:

  • Ray sets given in ASAP binary DIS-format can now be read as well. This is an additional option in illumination analysis.
  • OpTaliX can now be run with normal USER rights. Previously, administrator rights were needed to run OpTaliX. Note that for installation, including upgrades, administrator priviledges are still required. This change takes account of future requirements in Windows Vista.

Bug Fixes:

  • The ghost RGB-plot was inappropriately scaled. Now corrected.
  • Command syntax of ghost parameters has been revised for better consistency.
  • Many subtle changes concerning improvement of the user interface.

Version 6.60
New Features:

  • In ghost analysis, the image of the source which caused ghost effects can now be rendered together with ghost images. This gives a combined image (source + ghost) and allows a better judgement of ghost intensity in relation to the nominal image intensity.
  • Ghost parameter can now saved with lens prescription.
  • The definition of variable coating thicknesses in coatings attached to optical surfaces now allows non-symmetrical thickness variations. Previously, only radial variations could be modeled. See CTV command.
  • OSLO export: Now supports fictitious glasses. The exported fictitious glass data are written to a file compatible with the OSLO private glass catalogue.
  • Macro language: A RETURN statement has been added to pass variables to calling functions.

Bug Fixes:

  • In transmission analysis, POL and TRA settings were sometimes erroneously ignored. Now fixed.
  • Wavefront analysis improved. In systems containing combinations of Zernike deformations and tilt/decenter on the same surface, a spurious tilt of the wavefront has been eliminated.

Version 6.59
New Features:

  • PSF-data are now written in E-format as opposed to the fixed format used previously. This allows a more accurate representation of numeric PSF-data.
  • Results from ghost analyses now allow logarithmic plots.

  • Multiple sources are now allowed in illumination analysis. Previously only one source could be simulated.
  • Illumination analysis now supports sources defined by ray sets. Also allows import of ProSourceTM ray files for modelling real light sources.
  • Export to ASAP improved (biconic and anamorphic surface included).
  • Hologram phase plots improved.

Bug Fixes:

  • In transmission analysis, POL and TRA settings were sometimes erroneously ignored.
  • Ghost analyses failed in systems using aspheric surfaces of types AAS, SPS ODD and SPS XYP. Other aspheric surface types were not affected.
  • Aspheric deviation plots (ASD command) now plots coefficients of anamorphic (biconic) surfaces. This was previously omitted.

Version 6.57
New Features:

  • The wavelength interval in transmission plots can now be arbitrarily defined. A new command "TRA STEPS" is available to define the number of sample points within the system wavelength range.

Bug Fixes:

  • Spot vs. zoom position plot could crash if the optical system was not zoomed (i.e. fixed focal length).
  • In MTF calculations, the optional parameter zk (zoom position) was not recognized.

Version 6.55
New Features:

  • A printer symbol has been added to the main toolbar to simplify printing all, or selected text from the text window.
  • Plots of RMS-spot vs. field now shows spot-diameter. Previously spot-radius was used as default. This makes this plot consistent with other commands (compare with SPD and SPR commands).
  • PSF data can now be written to an ASCII file. See the PSF command with the optional FIL parameter.
  • A new command GPSF calculates geometric PSF. It is based on geometric ray tracing (i.e. no diffraction) and is useful in systems with large aberrations.
  • Glass P-SF67 from Schott is new and has been added to glass catalogue.
  • CDGM glass catalogue added. This catalogue replaces the generic chinese glass catalogue.
  • Get access to all ray data, respectively store it in a file. A new command RAYLOG has been added, which allows logging of ray data to a file. This command is quite general as ANY ray data at a specific surface can be stored.
  • Code V Import: Unrecognized commands are now reported in a log-file.

Bug Fixes:

  • Scaling system data with overall length requirement (SCA OAL) corrected.
  • Improved window handling. Previously, putting a graphic window to foreground could lead to improperly scaled plots.
  • Parameters passed to macros were not correctly handled and the program hung in an infinite loop. This bug was inadvertently re-introduced in version 6.50.
  • Iteration for real field coordinates (XRI, YRI) could fail in zoom systems due to uninitialized start parameter.

Version 6.50
New Features:

  • Array parameter are now also accessible in the surface editor. Previously, only command line input was accepted.
  • The number of plot rays allowed in lens layout drawings is now unlimited. Previously, a maximum of 500 rays could be plotted.
  • The coating material editor has been enhanced. In addition to user-defined (private) coating materials, predefined (catalogue) coating materials are also shown. This gives a better overview about the coating materials available.

Bug Fixes:

  • Inserting lens systems from lens catalogues corrected. Previously, surfaces following the inserted system could have been corrupted.

Version 6.46 / 6.48
New Features:

  • Improved automatic scaling of 2D-aspheric deviation plots.
  • Improvements on importing cylinder surfaces from Code V and Zemax files.
  • Import from OSLO now takes account of changes made to special apertures in the OSLO package.

Bug Fixes:

  • Surface editor: Pickups at XDE/YDE/ZDE and ADE/BDE/CDE were not correctly recognized.
  • Importing files from other design packages now automatically adds the appropriate file extension, if omitted (for example .seq, .zmx, .len, etc.)
  • Transmission calculation using multilayer coatings corrected.

Version 6.44
New Features:

  • Anamorphic asphere surface added. With absence of higher-order coefficients this surface type is also sometimes referred to as biconic surface.
  • Cylinder surface added. Even though cylinders can be modelled using the EVEN asphere, a separate surface type "cylinder" has been added to simplify data input.
  • Enhancement to Import/Export filters:
      - OSLO : Now supports both extensions, *.len and *.osl.
      - OSLO : Now recognizes RETurn coordinates to a previous surface.
      - Code V: Now supports surface labels (surface comments).
  • 2D-aspheric deviation: Now also allows reference to best-fit sphere. Plots have been amended with reference sphere radius, RMS- and PV- deviation.
  • Edge thickness (ET) calculations now also work with decentered/tilted surfaces and in non-sequential environments.

Bug Fixes:

  • Corrected dn/dT for plastic materials PMMA and POLYCARB.
  • CUX variable not recognized in surface editor.

Version 6.40
Bug Fixes:

  • Corrected bug in storing/restoring user-defined GRIN coefficients.
  • Copying surfaces containing user-defined GRIN media now works correctly.

Version 6.36/6.38
New Features:

  • Dn/dT coefficients for Zeonex plastic materials updated.
  • Topas 5013 plastic material added.
  • Minor improvements to the ghost lens layout plot (ghost view).
  • Export to ASAP added.
  • Logarithmic display added to illumination plots.

Bug Fixes:

  • The surface editor was not properly updated with CAM-mode enabled (i.e. CAM Y).
  • In optimization, strictly symmetric problem cases could lead to a false identification of ineffective variables and removal of these variables from optimization.
  • Minor corrections to the command line and macro parser.

Version 6.33
New Features:

  • Violations of optimization constraints, (equal, less than, or greater than) are now also indicated by a bar of asterisks (***) to allow easier identification of problem cases. See the outputs generated by the commands LIS OPT or ERRF.
  • Variables in macros and command line input now may also contain strings.
  • Globally referenced surfaces (see GLB command) now may also be of DAR tilt type. Previously, only NAX tilt type was allowed at global references.
  • Grid distortion analysis (see PLO GID) now also works for decentered and tilted systems where paraxial references may be inappropriate. Now the (distortion-free) reference grid is based on real rays which works for any kind of configuration.
  • Export to IGES added. The current implementation supports arbitrary tilts/decentrations, rays, apertures trimmed surfaces and edges.
  • Lens edge apertures may now also edited in the surface ediror, aperture tab. Previously, definition of lens edges was only possible from the command line.
  • Surface coordinates may also be defined/entered by a transformation matrix using the new TMAT command. This complements the XDE/YDE/ZDE and ADE/BDE/CDE commands.

Bug Fixes:

  • Minor glitches in the command line and macro parser corrected.

Version 6.28
New Features:

  • The index profile of coatings may now be plotted. See COA PRO command.
  • Alternative glasses with respect to a base glass may now be listed. See LIS ALT command.
  • Variable assignments in macros and command line input has been extended to handle strings.

Bug Fixes:

  • Two-character commands (such as NA) were not properly handled in zoom systems.
  • Improved string handling in IF-ELSE-ENDIF constructs in macros. Previously string comparisons could fail if strings were specified in mixed upper/lower case.

Version 6.26
New Features:

  • Defining pickups has been greatly reworked and enhanced. It is now possible to define group pickups and individual pickups with tilt/decenters and aspheres. For example, a pickup may now be applied on XDE only without affecting other tilt/decenter parameters at the same surface. The same holds for aspheric pickups.
  • In conjunction with pickups, the commands CPI, DPI, API, TPI, MPI are obsolete (though still functional for backwards compatibility) and are superseded by the corresponding PIK XXX commands.
  • New material added: Diamond
  • Surfaces with the TIR flag (total internal reflection) in sequential mode now check any index ratio n/n'. This is specified by the materials in GL1 and GL2. Previously, TIR was calculated against AIR only.

Bug Fixes:

  • Pickups of SPS ODD and SPS XYP surfaces were not properly recognized.

Version 6.25
New Features:

  • Coating names up to 256 characters (including path) are now supported.
  • A new surface qualifier "g" has been added. It allows output of ray coordinates in global coordinates referred to another surface specified by the "g" parameter. For example "Y s2 f4 g3" outputs ray data with reference to the coordinate system of surface 3.
  • Code V import: Greater flexibility of importing zoomed parameters in sequential files.
  • Checks added to non-sequential parameters to support setup of non-sequential surface ranges.
  • Updated lens catalogs.

Bug Fixes:

  • Restoring systems from the menu option Optimization -> Undo optimization cycle now works again. This bug was erroneously introduced in version 6.22. Earlier versions were not affected.
  • After closing the slider control dialog, it could not be displayed again.
  • Under certain conditions rays could not be traced to SPS XYP surfaces. Now fixed.

Version 6.22
  • Columns in editor windows (such as surface editor, coating editor, Zernike editor, etc) can now be resized by the user. To resize a column, drag the divisions between column labels.
  • Added toolbar icons in zoom editor for easier access to append zoom parameters, change number of positions and get help.
  • Slider controls added to allow interactive changes of construction parameters.
  • IF constructs are now supported in macros.
  • GL2 now accepts private glasses.
  • Variables for SPS ODD and SPS XYP surfaces were not accepted in the command line. This has been fixed.

Version 6.21
Maintenance Update:

  • Minor improvements on ray aiming.
  • Minor corrections on parsing arithmetic expressions in macros.
  • Buttons to print and search the contents of the text window have been added.

Version 6.18
  • Corrected edge drawing in 3D layout window.
  • Code V import now handles zoomed glasses correctly. The ZOO prefix, however, is still required in sequential files (*.seq).
  • In illumination analysis, minor corrections on ray distribution.
  • Zoom positions are now taken into account in illumination analysis.
  • In wavefront RMS analysis (see WAV command) it is now possible to subtract wavefront tilt.
  • Corrected TCE values for quartz, silica and sapphire in the special glass database.
  • Glasses added to Schott catalogue: P-PK53, P-SK57, P-LASF47

Version 6.16
Maintenance Update:

  • Fixed program crash when inserting several zoom positions successively from the zoom editor window.

Version 6.15
Maintenance Update:

  • Minor improvements on radial and 2D aspheric deformation plots.
  • In ISO element drawings, surfaces were shown reversed if a lens followed a mirror. Now fixed.
  • Invoking the configuration dialog with several other windows opened could hang the program. This effect was erroneously re-introduced in version 6.14. Now fixed.

Version 6.14
New Features:

  • New glasses added: Schott N-SF14, N-LASF46A
  • Variables may now be combined with qualifiers for surface, field, wavelength or zoom position. For example, "s2" (without the quotes) may now also specified as  s$x, assuming a previous variable assignment  $x = 2. The same applies to fields (f$x  will be interpreted as f2), wavelengths (w$x  is interpreted as w2) and zoom positions (z$x  is interpreted as z2).
  • Automatic oversizing of surface apertures is now possible by factor or by a fixed value applied to each surface. Previously only "by factor" was possible. To be set in the Preferences, operations tab.
  • Aspheric deformation plots can now also shown as 2-dimensional height field in either wire-grid, contour or false-colour mode. Previously only radial scans over the surface were possible.
  • The coating material editor now supports up to 600 data points per material. Previously, only 100 points were allowed.

Bug Fixes:

  • Entering non-digit values in the asphere pickup column of the surface editor caused the program to crash.
  • The program crashed at  MTF FLD  plots when the number of fields was >11. This was due to an inappropriate allocation of work arrays. Now corrected.
Version 6.10
New Features:

  • Setting vignetting factors now also reports surfaces which cause vignetting (see SET VIG command).
  • Test plates from Wolf-Optik, Germany, added.
  • Surfaces selected in the surface editor (i.e. the row which has focus) are now highlighted in the lens layout plot by blue colour.
  • New glasses added:
    Schott : N-FK51A, N-LASF31A, N-SF11
    Ohara : L-LAH81, L-LAM72, S-BSM21, PBH55, PBH56, LAH80, S-TIH20 and Clearceram-Z as CERAM-Z, CERAM-ZHS
    Corning: C7056
  • Cylindrical GRIN lenses from Grintech (Jena, Germany) added. In addition to the radial profiles (short code: GRT), cylindrical profiles are accessed by the short code GRC.

Bug Fixes:

  • MTF vs. frequency was incorrect when only two wavelengths were specified and wavelength weighting was not uniform. Now corrected.
  • In coating optimization, the program crashed if the number of coating optimization targets was >100. Now fixed.
  • Through-focus geometric MTF window caused a program crash if the window was resized.
  • Coating material editor did not accept data for the first private material defined.
Version 6.08
  • In transmission analysis, output of surface contribution now takes orientation of input polarization into account. Previously only the average value of S- and P-components was printed.
  • Relative irradiance (RIRR) calculations now correctly include transmission effects which may be caused by bulk absorption or reflection losses.
  • RAD (radial energy) is now correctly returned as database item (LDI).
  • IC command added. Allows selection of alternate intersection of rays with a surface.
  • Code V import/export: IC command is now recognized.
  • PSF: Gray level and false colour plots were improperly placed for NRD > 32. Now corrected.
  • Glasses from ArcherOpTx are now fully integrated in OpTaliX
  • DO/ENDDO constructs in macros were not properly executed. This bug was erroneously re-introduced and affected versions 6.02 to 6.05 only.
Version 6.05
  • Accuracy of diffraction MTF calculation has been significantly improved for sparse sampling of the pupil (NRD < 32).
  • The dialog for editing optimization variables/targets is now modeless, that is, it can stay permanently opened. This allows faster access to optimization variables/targets without blocking other analysis or editing options.
  • For consistency reasons, the defocus term is now defined by "THI si" throughout the program. The previously used term "DEF" is now obsolete, though still supported for backwards compatibility.
  • Extensions to Code V import/export:
    • PIM and THI si relationship now works reliably. This ensures correct position of image plane during file conversions.
    • field colours are now only exported if they were explicitly user defined,
    • PUI, PUX, PUY, MRD are now correctly imported/exported.
  • Extensions to Zemax import/export:
    • GRIN profiles from Gradient Lens Corp. (GLC) are now correctly converted.
  • The ability to specify a reduction ratio for lens modules has been added (see MRD command).
  • Coating optimization targets can now inserted, deleted and sorted.
Version 6.04
  • Exporting RGB-images to BMP,PCX and PNG now correctly renders colour depth (24 bit).
  • Environmental analysis with material pickup caused the program to crash. Now fixed.
  • Corrected Code V controls KC, AC, BC, CC, DC, EC, FC, GC, HC.
Version 6.03
  • Corrected parsing error on GLP command.
  • Improved processing speed of $variables in macros.
  • A subset of Code V control codes to define optimization variables are now imported and exported. The recognized control codes are: THC, CCY, CCX, KCC, ACC, BCC, CCC, DCC, ECC, FCC, GCC, HCC, XDC, YDC, ZDC, ADC, BDC, CDC, GLC.
Version 6.00
  • DISX was not accessible as lens database item (LDI). Corrected.
  • Third-order aberrations did not accept "zk" qualifiers. Now corrected.
  • Attaching coatings to surfaces caused the program to crash. Now repaired.
  • CLS command issued error messages even though syntax was correct. Now repaired.
  • Long values entered into editor cells are now parsed correctly again. Previously numeric input was truncated after 11 characters.
  • Negative scaling factors for spot and fan plots caused a reversal of aberration display. Now corrected.
  • The program crashed if PSF TRU option was called with only a single wavelength.
  • Glass boundaries (GLP) are now saved with lens data.
  • Principal plane locations are now available as database items by SH1,SH2 commands.
  • The size of markers used in spot diagrams is now adjustable via the SPMS command. The size can also be globally defined in the preferences section (miscellaneous tab).
Versions 8.xx to 9.xx Summarizes history of obsolete versions 8.xx to 9.xx
Versions 7.xx Summarizes history of obsolete versions 7.xx
Versions 5.xx Summarizes history of obsolete versions 5.xx
Versions 4.xx Summarizes history of obsolete versions 4.xx