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OpTaliX Version History

Obsolete Versions 8.xx - 9.xx


Version 9.95 (a)
(03-09-2019) 		Changes to version 9.95 (a):

  • A critical error has been detected: The SPD (spot diameter) function did no longer work in optimization. The bug was erroneously introduced in version 9.92
  • The update installer did not properly copy the usergrin.dll and usersur.dll files. As a result, the program could not be started after the upgrade. Now corrected.
  • Minor tweaks.
Version 9.92
(27-07-2019) 		Bug Fixes in version 9.92:

  • Distortion calculation corrected if the field was defined by paraxial image height. Previously, the program did not account for defocus effects.
  • A very exotic raytrace error at very steep aspheres has been eliminated.
  • The spot diameter [SPD], when used within a user defined function did not return the result correctly.
  • Minor tweaks.
Version 9.85
(10-03-2019) 		New Features in version 9.85:

  • The KEFS, KEFT (knife edge function) and ECE (encircled energy) options now accept the zoom specifier (e.g. z2) in the command line. Previously, zoom position 1 was always used.
  • Refractive index model of Nitrogen added.
  • SCHOTT and OHARA glass catalogues updated.
  • The Gaussian source model in illumination was truncated at 13.5% intensity (1/e2). Now, truncation has been set at 0.19%, which gives a more realistic representation.
  • Design Example Library: Array examples improved.

Bug Fixes in version 9.85:

  • Surface Editor: Pasting (copying) multiple data (columns, grids) from the clipboard or editing drop-down menues resulted in unnecessary long delays and the surface editor was temporarily not usable.
  • The solve on edge thickness did not work if X-type surfaces (coordinate transforms) were involved.
  • User defined DLL's are no longer overwritten during upgrade installation.
  • Minor tweaks.
Version 9.75
(11-11-2018) 		New Features in version 9.75:

  • Update of HOYA glass catalogue.
  • A new analysis graph has been added: Plots the RMS spot diameter vs. wavelength. This graph complements the RMS spot vs. field plot.
  • Through-Focus MTF is now calculated, even if the image surface is globally referenced to a previous surface. Normally, this fixes the position of the image surface and prevents any variation of the Z-position. Now, the program detects this condition and moves the global reference temporarily for this calculation.

Bug Fixes in version 9.75:

  • User-defined surfaces (UDG type) were not correctly rendered in the X/Z lens layout plot. Note: This only affected the X/Z plots, the Y/Z plots are correct.
  • The MTF results were inaccurate in the order of a few percent, depending on the optical system parameter. This was due to synchronization problems of parallel processor threads.
  • Through-Focus MTF was partially incorrect. The full wavelength spectrum was not always correctly taken into account. Monochromatic results were returned instead of polychromatic calculations.
  • Minor tweaks
Version 9.70
(16-09-2018) 		New Features in version 9.70:

  • Updated reference manual: Added instruction of creating user defined DLL's using the Microsoft Visual Studio 2015 and higher.
  • Fitting Zernike coefficients to the system wavefront now also allows selection of the zoom position. Previously, the zoom position was undefined in this fitting process.
  • DLLs containing the code for user defined surfaces and user defined GRIN profiles (usersur, usergrn) are now located in the "Program Data" directory. Previously, these DLLs were located in the "Program Files" directory, which required administrator rights. Now, normal user rights are sufficient.
  • New commands: KEFS and KEFT calculate the width of the "Knife Edge Function (KEF)" in sagittal direction (KEFS) and in tangential direction (KEFT) on the basis of low (KEFL) and high (KEFH) intensity levels.

Bug Fixes in version 9.70:

  • Non-sequential raytrace: An accuracy problem could occur if the physical separation of two non-sequential surfaces is less than 1E-10 mm. I such cases, the correct intersection point was not always found.
  • Minor tweaks
Version 9.60
(18-03-2018) 		New Features in version 9.60:

  • OPD (optical path difference) aberrations can now be referenced to the current wavelength or to the reference wavelength. This is a subtle distinction that may be important in some crucial applications. A switch in the preference settings now allows global setting wether to refer the physical optical path to the reference wavelength or the currently used wavelength.
  • Asphericon lens catalogue updated.

Bug Fixes in version 9.60:

  • The RPWR command (received power) in illumination analysis did not clear previous results. Consecutive runs of this command created different results.
  • Fan aberration curves were not plotted under special conditions, for example in systems where only one field but many zoom positions were defined.
  • Problems with the programming interface to DLL's (dynamic link libraries) have been fixed. Previously, DLL's describing user-defined surfaces and user-defined GRIN's were not correctly recognized.
  • Parallel execution of computing intensive calculations improved. In this 9.60 release, special emphasis was put on acceleration of illumination calculations.
  • Minor tweaks
Version 9.50
(31-12-2017) 		New Features in version 9.50:

  • The ray aiming algorithm has been significantly improved. In particular, special very wide-angle lenses (e.g. Fisheye lenses) benefit from this improvement. Also, the ray aiming speed on this type of lenses is improved.

Bug Fixes in version 9.50:

  • The Zemax import/export filters now correctly recognize the biconic surface type (BICONICX).
  • Calculation of paraxial quantities corrected for systems containing diffractive/HOE structures. This error occured only if more than one grating/HOE was simultaneously used in an optical system.
  • Minor tweaks
Version 9.35
(27-08-2017) 		New Features in version 9.35:

  • CDGM glass catalogue updated.
  • At user request, the raylog command, which allows logging of ray data into a file, is now available in the LT version also.
  • Import of Nastran generated surface deformation files now accounts for lateral shifts of the deformation data. In addition, the imported data can now rotated.


Bug Fixes in version 9.35:

  • Import of Code V files, containing lens modules (MOD), corrected. Previously, the exit surface was not correctly recognized/inserted in the converted file.
  • The ASF and ASO commands were not correctly handled in Zoom/Multiconfiguration systems and in the zoom editor.
  • Statistical tolerance analysis could crash if permanent graphics update was enabled
  • The autofocus (AF) command did not reliably accept the focussing parameter (WAV, SPD, etc) in the command line or in macros.
  • Import of Nastran generated surface deformation files now account for lateral shifts (offsets) of the deformation data.
  • Minor tweaks
Version 9.30
(28-05-2017) 		New Features in version 9.30:

  • Exporting systems to the POV (Persistence of Vision) renderer now enables options to plot rays and quarter-cuts through lenses, which helps to improve visual perception of the layout.


Bug Fixes in version 9.30:

  • Macro sequences that included restoring (loading) of design files failed, because loading a new file initialized macro variables that were needed for correct operation of the macro itself.
  • Exporting systems to Code V incorrectly translated glass names from the obsolete catalogue.
  • This is somewhere between a new feature and a bug correction: Import of Code V zoom systems now accepts up to 100 zoom positions (compared to 30 previously).


  • Import of Code V files now recognizes diffractive surface parameters (hologram or grating surfaces)
  • Import of Code V files containing lens modules (MOD) corrected.
  • Inverting a system (or parts of it) did not invert tilt modes as well.
  • The ECE, EQE commands did not recognize the field qualifier correctly.
  • Minor tweaks
Version 9.20
(28-12-2016) 		New Features in version 9.20:

  • The command MAXAOE was added to complement the MAXAOI command. MAXAOI calculates the maximum angles of rays incident on a surface, MAXAOE calculates the maximum angles of rays exiting a surface.


Bug Fixes in version 9.20:

  • Requests to the database items CX, CY, CZ in optimization or in macro function calls did not return reliable results. This problem only occurred when coordinates at the image surface were specified. Similar queries at other surfaces were not affected.
  • In the examples library, glasses used in some designs have become obsolete over the years. So, the old glasses have been replaced by similar (best fit) glasses that retain the original correction status as good as possible.
  • Third order analysis (THO command) did not return valid Seidel coefficients when field angles instead of object heights are specified at finite object distance.
  • The BFL command could crash the program if the object distance is zero.
  • The plot index vs. coating layer showed the file name of the optical system in use, instead of the selected coating file.
  • Ghost analysis corrected when the ghost intensity is analyzed at a surface other than the image surface.
  • Decentrations were not correctly considered at QCON and QBSF aspheres.
  • Statistical tolerance analysis crashed when the "back focus" compenstor was enabled. Other compensator types (e.g. "optimization") worked without problems.
  • Minor tweaks
Version 9.10
(01-07-2016) 		New Features in version 9.10:

  • Added command APT to facilitate change of aperture types (shapes) in zoom/multiconfiguration environments.
  • Private glasses defined in the PRV-END environment now accept Laurent and Sellmeier dispersion coefficients, in addition to the standard wavelength-index data pairs.
  • CDGM glass catalogue updated.
  • NHG glass catalogue added.
  • Added new glasses to Hikari/Nikon glass catalogue: J-KZFH4, J-LASF021HS, J-LASFH13HS, J-LASFH17HS, J-LASFH22, Q-LAFPH1S, Q-LASFPH2S.


Bug Fixes in version 9.05:

  • Rays emitted from illumination sources are now correctly drawn in the lens layout plot. Previously, systems containing Q-type surfaces were not correctly rendered.
  • OpTaliX-LT, 32 bit, did not run under Win-XP. This has been corrected. In this context we want to emphasize that we are striving to make all editions of OpTaliX (PRO,EDU,LT) compatible with Windows XP and Windows, 7, 8, 10.
  • Export of data to Excel is now working again. Row and column data were erroneously interchanged.
  • In systems where the ray aiming method ENP (aiming to the paraxial entrance pupil) was selected, the ray grid for calculating spot, PSF, etc., was unpredicted. This could lead to inaccurate (but not false) results. The problem was erroneously introduced in the attempt to automatically correct for unusually large pupil distortions.
  • Minor tweaks
Version 9.05
(24-04-2016) 		New Features in version 9.05:

  • Updated coating materials library with complex index data for copper, MIRA and NiCr. These materials are often used in high reflective mirror coatings.


  • Added new functions to command line and macros: RAND: Random number generator, RAND SEED: Set seed for random number generator.


  • In systems exhibiting strong pupil distortion, where the entrance pupil size varies significantly with field angle (for example in extreme wide-angle lenses,) calculation of the true entrance pupil has been improved. This ensures that the ray beams always fill the real pupil correctly.


  • A graphical representation of third order (Seidel) aberrations has been added. The aberration coefficients are shown as vertical bars.


  • Distortion Grid: Export of 2-dimensional distortion data is now possible to Excel and ASCII files.


Bug Fixes in version 9.05:

  • The tolerance parameters DLA,DLB,DLC were incorrectly retrieved from older design files that were generated prior to version 8.00.
  • ISO element drawing parameters were not always saved as expected.
  • Minor tweaks
Version 8.96
(14-08-2015) 		New Features in version 8.96:

  • OpTaliX has been successfully tested under Windows 10.
  • Non-symmetrical distortion in decentered and off-axis systems is now calculated by differential raytracing. The program automatically detects non-symmetrical systems. No special user interaction is required.
  • Glass catalogues from NIKON and HIKARI updated. The prefix to glass names has changed. For example, Hikari glass H-E-FK5 is now accessible under J-FK5. Note that the HIKARI and NIKON glass catalogues are identical.
  • Added Corning fused silica types HPFS7979, HPFS7980, HPFS8655 to special glass/material catalogue.
  • Improved support of illumination commands in macros. Previously, illumination distribution results had to be exported by hand and could not be automated in macros.
  • Zernike coefficients fitted to wavefront deformation are now accessible in macros and commands. See commands WZRN and WZACT.


Bug Fixes in version 8.96:

  • The melt (private) glass catalogue got corrupted if glass names more than 14 characters were used. Now, glass names up to 64 characters are allowed also for private (melt) glasses.
  • Minor tweaks
Version 8.92
(07-03-2015) 		Maintenance Update:

  • Tolerance parameters (TOLC, TOCL, DEL TOL) when entered in the command line were not correctly updated in the tolerance editor. Synchronization of data between command line and tolerance editor is now improved.
  • MTF vs. Field Plot: Error message improved in case of insufficient number of field angles specified.
  • Importing random (scattered) surface deformation data improved. See menu option File -> Import -> Random surface data. Also, when ray tracing this surface type, a sign error has been eliminated.
Version 8.90
(04-01-2015) 		New Features in version 8.90:

  • Aspheric deformation can now be exported as a data grid with reference to any other surface, i.e. the surface data grid is given in global coordinates. See ASD2 command for details.
  • Tolerance analysis now allows separate definition and display of compensator statistics. Now, the amounts and statistical distribution of compensator parameters adjustments can be displayed and analyzed independently of performance parameters. A new tab "Tolerance Compensators" was added.
  • Updated OHARA glass catalogue. Many new glasses added: S-FPL55, S-FPM3, S-LAH88, S-LAH89, S-Lah92, S-NBH56, S-NBH57, S-NPH4, S-NPH5, S-BAL43, S-LAH90, S-LAH91


Bug Fixes in version 8.90:

  • In zoom/multi-configuration systems, parameter strings containing blank characters are now recognized and supported. In particular, file names including blanks are now correctly handled.
  • Import of coating designs from MacLeod files, in which layer thicknesses are defined by physical thickness (in nanometers), instead of optical thickness as is the default, could fail. The import routine has now been improved as to safely distinguish between optical or physical layer thicknesses in MacLeod coating files.
  • In optimization, parsing of complex constraints, such as lens database items (LDI) combined with mathematical expressions, has been improved. Some glitches were eliminated.
  • Minor tweaks
Version 8.82
(20-07-2014) 		New Features in version 8.82:

  • In ISO element drawings, two alternative glasses/materials per lens can now be specified.
  • Strehl ratio analysis now also supports zoom/multiconfiguration positions. Applies for Strehl vs. field and Strehl vs. wavelength analyses.
  • Illumination analysis: Spatial and angular FWHM (full width half maximum) values are displayed along with intensity distribution plots.
  • Added new Schott glass N-FK58. Note that Schott has not yet published dndT data.
  • Schott glasses N-SF57HTultra and N-SF6HTultra corrected in glass database.


Bug Fixes in version 8.82:

  • The prescription listing (LIS command) now reports coefficients of XYP aspheres correctly. The coefficients listing of this asphere type was inadvertently omitted in previous versions.
  • The length of variables and format definitions is now extended to 128 characters, which conforms to the description/specification in the manual. Previously, variables and formats were limited to 60 characters. This modification both affects macros and command lines.
  • Minor tweaks
Version 8.80
(04-05-2014) 		New Features in version 8.80:

  • In illumination analysis, an option was added to analyze angular intensity distribution, i.e. the relative intensity as a function of the emitted/received angle.
  • Added a new tolerance parameter, now simulating rotationally symmetric aspheric surface perturbations. The symbolic name is SYM. This completes full simulation of surface tolerances according to the DIN/ISO 10110-5 standard. Note, the ISO 10110 surface nomenclature 3/ A (B,C) are represented in OpTaliX by the DLF (IRR,SYM) parameters.
  • Tolerancing: The units for tilt tolerances (DLA, DLB, DLG) have been changed to minutes of arc. Previously these tolerances were defined in degree. Specifying tilt tolerances in arcminutes is more advantageous as it allows an easier and direct correspondance with tilt tolerances typically given on lens drawings. On restoring older files containing tolerance data in degrees, DLA, DLB, and DLG are automatically converted to arcmin.
  • Menue item and shortcut (Strng-Alt-M) added to close all opened windows.


Bug Fixes in version 8.80:

  • Tolerance data were not properly shifted in the tolerance editor on inserting or deleting surfaces.
  • The program could crash on inserting a surface in a NSS environment.
  • Out of place sections in the PDF manual corrected.
  • Minor tweaks
Version 8.78
(02-03-2014) 		New Features in version 8.78:

  • Import of Zemax files now supports surfaces with extended asphere coefficients. The maximum number of coefficients is 16. On import, the coefficients are automatically converted to the ODD30 asphere type.
  • Added material Zeonex K26R
  • Number of allowable tolerance function increased to 8. Previously, only 5 tolerance functions were supported.


Bug Fixes in version 8.78:

  • Starting illumination analysis (ILL), including the commands RPWR, EPWR and NILR, from the command line did not work reliably. This effect was not observed when illumination analysis was started from the menu/dialog.
  • Macros: String variables are now reliably recognized, irrespectively whether they are enclosed in quotes or apostrophes (" or '). This effect was primarily recognized when concatenating strings.
  • Macros: Now, an unlimited number of strings can be concatenated. Previously, only two strings could be concatenated within a single command.
  • Tolerances: Restoring a sample tolerance file causes the program to crash if tolerance data from a previous tolerance run were unavailable, respectively the statistical tolerance file (tol_stat.txt) did not exist in the specific project directory.
  • Changes in the tolerance editor were not immediately accepted. Previously closing of the the tolerance editor window was required in order to make changes effective.
  • Minor tweaks
Version 8.74
(26-01-2014) 		New Features in version 8.74:

  • File saving options have been extended to "save" and "save as". Previously, saving a design always resulted in a "save as" dialog box. Quite often, this made saving designs tedious. "Save" immediately overwrites the file with the current design data, "save as" prompts for a new file name.
  • The macro editor window can now be brought to the background. Previously, the macro window always stayed on top and could make other windows unaccessible, unless the macro window is moved to a different position on the screen.
  • Added commands to retrieve parameters from illumination analysis:
    RPWR : total received power,
    EPWR : total emitted power,
    NILR : number of successful rays in illumination ray trace.


Bug Fixes in version 8.74:

  • The configuration dialog could "vanish" by an inadvertent click on the program's main window, if the configuration dialog was still opened. The program was then left in a non-operable state because the configuration dialog could no longer be closed.
  • OpTaliX now runs under Win-XP again. Due to use of newer API functions, not present in earlier versions like Win-XP, the typical failure mode was "... not a valid Win32 application". The software has been successfully rebuilt and tested for Win-XP backwards compatibility.
  • Minor tweaks
Version 8.72
(02-01-2014) 		New Features in version 8.72:

  • Obsolete (deprecated) glasses are now summarized in a separate glass catalogue, named "obsolete". The catalogue code is "OBS".
  • Improved data export to Microsoft Excel.




Bug Fixes in version 8.72:

  • Only minor tweaks
Version 8.70
(08-12-2013) 		New Features in version 8.70:

  • Code V import: Private glasses defined by Laurent coefficients (old Schott formula) are now correctly recognized. Note that the Code V syntax does not allow definition of the min/max wavelengths, i.e. the validity of the spectral range of the coefficients. A warning message will be issued and the user is requested to check the validity of the index data for this specific private glass.


Bug Fixes in version 8.70:

  • Incorrect assignment of "wavpv" operand (PV wavefront) in optimization.
  • Short form of entering hologram coefficients, e.g. HC3, was not recognized in commands. Note: The normal form is "HOC s3 c4 value", the corresponding short form is "HC4 s3".
  • Updating licenses failed due to incorrect reading of the license file. This problem was erronoeously introduced in versions 8.60 to 8.68.
  • Corrected program crash in case of systems containing Zernike surface deformations in conjunction with the LIS command. This was due to an inappropriate allocation of auxiliary arrays in the listing routine.
  • Minor tweaks
Version 8.68
(27-10-2013) 		New Features in version 8.68:

  • OpTaliX now supports up to 200 illumination sources simultaneously. Previously, only 20 independent sources were allowed.


Bug Fixes in version 8.68:

  • The program crashed on exporting EPS (encapsulated postscript) graphics.
  • Concatenation of strings failed in cases where the string was enclosed in apostrophes (') or double quotes (").
  • Printing concatenated strings in combination with variables failed.
  • Minor tweaks
Version 8.66
(29-09-2013) 		New Features in version 8.66:

  • Updated glass catalogues: Schott, Hoya, OHARA, CDGM, Sumita
  • Added internal transmission coefficients of optical cement NOA61 for wavelengths 310nm to 2000nm.


Bug Fixes in version 8.64:

  • Corrected small glitches in glass catalogues. Some glasses were not found due to upper/lower character conversions.
  • In configuration settings, NAO (numerical aperture object) was not always accepted when defined in the configuration dialog. Setting NAO from the command line was not affected.
  • Minor tweaks
Version 8.64
(16-08-2013) 		New Features in version 8.64:

  • Updated glass catalogues: Schott, Hoya, OHARA, CDGM, Sumita
  • Improved usage of parallel processors (multi-core) due to optimized instructions.


Bug Fixes in version 8.64:

  • Minor tweaks
Version 8.60
(16-06-2013) 		Note that support of the 7.xx editions (blue Hardlock key, 32-bit only) has expired. This 7.98 update version is the last supported version. Users are encouraged to migrate to the new 8.60 version. This migration is free for users with a valid support license.

New Features in version 8.60:

  • OpTaliX has been successfully tested under Windows 8 (both 32-bit and 64-bit). Windows 8 is now an officially supported platform.
  • Statistical (monte carlo) tolerancing is now available. This option supplements the sensitivity and inverse sensitivity options.
  • The tolerance editor is now a modeless dialog. This means that this editor may stay permanently opened, like other editors as surface editor, zoom editor, coating editor, etc. This allows easier and faster interaction between parameter changes and tolerance analyses.
  • Ray data from illumination analysis now also can be exported in binary format. Previously, only ASCII format was supported.
  • Schott filter glasses added: BG50, BG55, BG60, BG61, BG62, BG63, BG64
  • Schott chalcogenide glasses added: IRG22, IRG23, IRG24, IRG25, IRG26. These glasses are primarily intended for use in the infrared wavelength range between 1 and 12 micron.
  • Dn/dT data of private glasses can now be defined and saved. The appropriate dialogs have been extended appropriately. See the main menu under Glass Manager -> Create Melt Glass, or from Glass Manager -> Glass Catalogs, then selct the private catalogue.
  • The number of processors used in multi-core systems is now maintained between sessions. Previously, the number of processoer was determined automatically and manual settings had to be done for each session individually. This option can now be set from the OpTaliX main menu under File -> Preferences -> Miscellaneous Tab.


Bug Fixes in version 8.60:

  • Ray trace on two-dimensional (gridded) wavefront deformations corrected. Previously, the calculated aberrations were incorrect by a factor 2.
  • OpTaliX did not run under Win-8 64-bit. This problem is resolved by an updated Safenet/HASP dongle driver.
  • Minor tweaks
Version 8.50
(27-01-2013) 		Note that support of the 7.xx editions (blue Hardlock key, 32-bit only) has expired. This 7.98 update version is the last supported version. Users are encouraged to migrate to the new 8.50 version. This migration is free for users with a valid support license.

New Features in version 8.50:

  • Support of Q-type aspheric surfaces based on a new mathematical formulation using orthogonal polynomials published by G.W.Forbes. Both Q-types, Qbfs and Qcon polynomials are fully implemented as special surfaces. See also the SPS QBF and SPS QCN commands.
  • ISO lens element drawing: Added options to specify surface (polishing) grade and edge/chamfer ground symbols.
  • Coating files may also be stored together with the optical design file in the same directory. It is no longer required to collect all coating files in a separate coating directory ($install$\coatings\). This option allows easier transfer of optical design and coating design files in a project like structure.
  • Source structures or aperture masks defined in beam propagation analysis now may be loaded from bitmap images defined in files (BMP, PNG, PCX formats). This extends already predefined structures.
  • Added option to calculate radial diffraction zones of symmetric holgrams. This option supports manufacturing of hologram surfaces, accessed from the manufacturing menu.
  • Extended options to export coating properties (reflection, transmission, phase) to an ASCII file. The output file is a table over wavelength and incidence angles for given S/P polarization orientations, respectively average (S+P)/2 reflectivity/transmissivity. See also the EXP COA command.


Bug Fixes (versions 8.50 and 7.98):

  • In macros, premature termination of while loops in macros corrected due to a parsing error.
  • Illumination analysis with ray aiming option showed banding effects dependent on the number of processors used. This was a parallelization problem caused by incomplete data collection in multi-core environments.
  • In tolerance analysis, systems are now correctly restored to the previous state. Previously, the system could have been left in the last tolerance state.
  • Corrected ray trace on hole apertures in conjunction with tilted and/or decentered surfaces.
  • A crash on repeated BPR calculations eliminated. This was caused by inappropriate memory allocation.
  • Minor tweaks
Version 8.42
(01-10-2012) 		New Features in version 8.42:

  • Maintenance release.


Bug Fixes (version 8.42 only):

  • Optimization constraints including using lens database items (LDI) were not always correctly parsed.
  • Export of cylindrical surfaces to Code V updated. Previously, cylinder aspherical coefficients were omitted during export.
  • Under certain conditions, systems using array surfaces and processors with multiple cores created incorrect results in illumination analysis. The problem related to data integrity in parallel processor environments. Not observed in the single-processor version 7.90.
  • Minor tweaks
Version 8.40
(17-09-2012) 		New Features (all versions 7.90 and 8.40):

  • In coating transmission/reflection plots, improved interpolation of curves in case of sparse wavelength sampling.
  • When attaching coatings to optical surfaces, an option to specify the orientation of the coating on the surface has been added. This allows a better control especially on cemented interfaces.
  • The exit mode of OpTaliX has been changed. Closing the program normally invoked a conformation dialog box. Exiting the program, either by clicking on the (X) button or selecting the File|Exit menu option, now immediately closes the program. This change was motivated by allowing other processes (e.g. update installer) to close and restart a running application without waiting for user interaction.
  • A new mode of calculating glass dispersion offsets (DVO) was added. In addition to the standard mode based on the Abbe normal dispersion, now a second mode is available that maintains anomalous dispersion characteristics of special glasses. The mode can be defined by the DVOM command, or in the configuration dialog, ''general'' tab.


Bug Fixes (all versions 7.90 and 8.40):

  • Single ray transmission analysis: Reference wavelength was always used (instead of user defined wavelength) which lead to incorrect results.
  • A potential program termination has been eliminated. While this issue has been observed only under certain conditions in the 7.x versions and with 32-bit operating systems, it had the potential to occur with any Windows operating system version.
  • A potential crash has been eliminated in all contour plots where the plot extension or the range of data was near to zero.
  • Optimization constraints using user defined functions were incorrectly parsed under special conditions.
  • Illumination analysis: The total received power was incorret under special conditions, e.g. in systems with non-sequential environments.
  • Definition of private glasses within the PRV/END environment using only one wavelength lead to a crash of the program.
  • Minor tweaks
Version 8.39
(18-08-2012)
  • OpTaliX-LT is now also available in 32-bit and 64-bit versions.
Version 7.89 only
(05-08-2012) 		Maintenance release for versions 7.xx (Hardlock key, blue):

  • A potential program termination has been eliminated. While this issue has been observed only under certain conditions in 32-bit operating systems, it had the potential to occur with any Windows operating system version.
Version 8.38
(01-07-2012) 		New Features (all versions 7.88 and 8.38):

  • Automatic athermal glass selection option added. This feature searches for glass combinations to attain both achromatic and athermal correction in the paraxial domain. Found in Glass Manager menue.
  • The mouse wheel, where available, is now supported for zooming in/out in any graphics window. This function works in addition to the normal zoom function by dragging a subsection of the window graphics area, i.e. by moving the mouse with the left mouse button held down.
  • The autofocus option (AF) now allows automatic focus adjustments using globally referenced distances (THR command), in addition to normal sequential distances (THI command).
  • Improved support of constructing 2-point holograms. The parameters HV1, HV2 have been added to unambigously define the direction of the constructing wavefronts.


Bug Fixes (all versions 7.88 and 8.38):

  • Update problems in fiber coupling (CEF) dialogs and multi-mode dialogs (MMF) corrected.
  • In multi-mode fiber (MMF) calculations, an option for selecting the wavelength number has been added. This resolves inconsitencies with coupling efficiency (CEF) analyses.
  • Power calculation in illumination analysis corrected. Previously a source total power other than 1.0 resulted in incorrect received power.
  • Transmission analysis in non-sequential environments corrected. Incorrect assignemts of bulk absorptions lead to inconsistent results.
  • Calculation of bulk absoption of special materials in transmission analyses now corrected. Previously material properties of special materials were not reliably identified.
  • In aspheric deviation plots (ASD2D command), the RMS and PV values expressed in waves were incorrect.
  • Command line editing of zoomed parameters corrected. Previously, zoomed or multi-configuration parameters were not identified which prevented parameter change from the command line.
  • Parse error on "sin" function corrected.
  • Minor tweaks
Version 8.30
(29-04-2012) 		New Features (all versions 7.86 and 8.30):

  • Export of Knife Edge Functions (KEF) to ASCII and Excel files.
  • Updated Schott glass catalogue.


Bug Fixes (all versions 7.86 and 8.30):

  • A potential crash in footprint and ray intersection plots corrected. It was caused by incorrectly allocated arrays.
  • A potential crash in listing alternative glasses (ALG command) eliminated.
  • Knife edge functions (KEF): Synchronization of parallel processes using multiple cores on calculations improved. Previously, results were not always stable.
  • Interchanged S- and P- curves in system transmission plots corrected.
  • Minor tweaks
Version 8.26
(02-04-2012) 		New Features (all versions 7.84 and 8.26):

  • An option was added to set the threshold of warning messages for improperly index-matched coatings on optical substrates. Warning messages are disabled for ill-conditioned coating-substrate indices below this threshold. See preferences dialog, "misc" tab.
  • In illumination analysis, exporting the illumination distribution has been decoupled from the illumination calculation itself. It is now possible to export illumination data after completion of illumination ray trace. A separate "Export" tab was added to the illumination option dialog.
  • Improved optimization using hologram coefficients.
  • Full 3D placement of illumination sources with respect to the object surface is now possible. Previously, tilts of the object surface were not supported in placing illumination sources.
  • Export of transmission data to Excel/ASCII files now also writes the S and P polarization components separately. Previously, only average (mean) polarization was exported by default.


Bug Fixes (all versions 7.84 and 8.26):

  • Paraxial properties (EFL, focus) of systems involving 2-point HOE/diffractive elements corrected.
  • Creating melt glasses did not save CTE and specific weight values.
  • Coatings attached to rear side mirrors (Mangin mirrors) were not used in the correct order during ray trace and transmission/polarization analysis.
  • Transmission analysis in zoomed systems using coatings created spurious information output in the text window which slowed down analyses.
  • Importing coating design files from MacLeod Thin Film Software improved. Elimitated occasional errors in opening MacLeod (*.dds) files. Now also correctly reads horizontal and vertival plot extents from dds-files.
  • Eliminated a potential program crash in illumination analysis with thin-film coatings attached to surfaces, respectively transmission ray tracing activated.
  • Minor tweaks
Version 8.16
(06-11-2011) 		New Features:

  • Multi-processor versions of OpTaliX-PRO/EDU now available in 32-bit and 64-bit for all version numbers higher than 8.xx. Note that versions 7.xx or lower are now considered obsolete. Updates are still available but users are encouraged to switch to versions 8.xx or higher (requires exchange of dongles).

  • ISO drawing user dialog improved. Previously fields in the ISO dialog were automatically overwritten which made editing of parameters awkward.

  • Wavefront aberration plot has been extended with contour and false-colour plot styles. Previously, only a perspective wire-grid plot style was supported.

  • Support of Unicode character sets.

  • PSF diagonal field calculations now takes active/inactive field settings into account. Previously, inactive fields were calculated irrespective of the active/inactive field setting in the configuration dialog.

  • Faster convergence during ray aiming in extreme wide-angle lenses.



Bug Fixes (also included in version 7.80):

  • A potential program crash eliminated which occured occasionally on restoring optical design files. The crash was due to a memory allocation error on files with extended number of fields.

  • Macro language: Brackets within a text string (i.e. enclosed by apostrophes or double quotes) no longer issue an error message with termination of the macro.

  • Macro Language: Unexpected lower-case formatting in PRINT command corrected. Previously, mixed formatted output instructions resulted in an all lower-case output string, thereby ignoring text formatting enclosed in ampersands or double quotes.

  • Macro language: Parser error in nested SIN- and COS-functions, e.g. of the form "acos(cos(1))" corrected. Previously the innermost function was not correctly interpreted.

  • Import of Zemax files could fail due to an incorrect parameter assignment, and if the file was stored in Unicode format.

  • Automatic scaling of ray intersection plots (RIS) improved. Previously, forcing automatic scaling by entering scale factor 0 resulted in an empty plot.

  • A crash in the Zernike Editor was eliminated. It occured on repeated calls to the Zernike dialog.

  • In the glass manager option, private (melt) glasses could created but were not recognized by the program. Now corrected.

  • Import of Zemax files could fail due to an incorrect parameter assignment.

  • A crash in the Zernike Editor was eliminated, which could occur on repeated calls of the Zernike dialog.

  • In the glass manager option, private/melt glasses could created but were not recognized by the program. Now corrected.

  • Grid distortion plot corrected.

  • Ray tracing at 2-point hologram surfaces corrected. Erroneously, signs of the two constructing spheres were not correctly considerd.

  • Minor tweaks
Versions 7.xx Summarizes history of obsolete versions 7.xx
Versions 6.xx Summarizes history of obsolete versions 6.xx
Versions 5.xx Summarizes history of obsolete versions 5.xx
Versions 4.xx Summarizes history of obsolete versions 4.xx