| Main Features |
LT |
Pro/Edu |
| Unconstrained 3-dimensional raytracing |
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| Non-sequential raytracing |
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| Arbitrary sequence of tilts and decenters |
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| Global 3-dimensional referencing of surfaces |
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| ZOOM and multiconfiguration Systems (unlimited number of positions, all lens parameter can be zoomed) |
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| CAM calculation for zoomed systems |
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| Integrated thin film multilayer analysis and optimization |
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| Vector based polarization raytracing and analysis (with "real" coatings applied to surfaces) |
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| Wavefront propagation analysis |
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| Environmental analysis (temperature, pressure) |
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| Tolerance analysis |
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| Polarization analysis |
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| Specification Data |
LT |
Pro/Edu |
| Number of fields |
10 |
unlimited |
| Number of wavelengths |
11 |
11 |
| Number of zoom positions |
unlimited |
unlimited |
| Geometric Analysis |
LT |
Pro/Edu |
| Spot diagrams vs. fields and wavelengths, through focus, full field |
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| Ray aberration fans (transverse, longitudinal, optical path difference) |
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| Distortion (classical, f-q, full field grid) |
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| Astigmatism vs. field and wavelengths |
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| Longitudinal colour (secondary spectrum) |
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| Transverse colour vs. field and wavelengths |
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| Paraxial and third-order (Seidel) analysis |
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| Footprint analysis |
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| Geometric Modulation Transfer Function (MTF) |
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| Geometric Point Spread Function (PSF) |
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| Geometric Encircled Energy |
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| Quadrant Detector Analysis |
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| Vignetting analysis |
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| Ghost analysis, does not require rebuilding of the optical system. |
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| Transmission analysis (including effects of coatings and bulk material absorption) |
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| Polarization analysis |
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| Illumination analysis |
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| Surface ray intersection plots |
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| Transverse or angular aberrations |
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| Longitudinal aberrations |
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| Diffraction Analysis |
LT |
Pro/Edu |
| Diffraction Point Spread Function (PSF) with many display options
(perspective plot, gray-coded plot, false-colour plot, true-colour plot,
contour plot, tangential/sagittal scan, full-field plot). |
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| Encircled/ensquared energy |
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| Diffraction MTF (vs. field, frequency, defocus, 2-dimensional MTF) |
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| Strehl ratio (numerical, vs. wavelength, vs. field) including apodization |
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| Wavefront aberration (vs. field, vs. wavelength, numerical RMS values) |
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| Zernike analysis of wavefront |
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| Interferogram analysis |
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| Gaussian beam analysis |
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| Coupling efficiency analysis (including predefined single-mode and multi-mode fibers) |
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| Physical optics beam propagation (BETA) |
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| Extended image analysis |
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| Tools |
LT |
Pro/Edu |
| Autofocus for selectable fields, wavelengths and performance criteria |
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| Scale and invert system or parts of it |
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| Copy, move and insert surfaces, also from other designs. |
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| Set magnification |
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| Find nearest glass in catalogue given a fictitious (MIL) glass |
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| Weight, volume and center of gravity |
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| Automatic glass selection for apochromatic correction |
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| Find optimal coating indices for gradient index lenses |
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| Analytical setup of standard designs such as best-form lens, achromats, compound telescopes
(Cassegrain, Ritchey-Chretien, Lurie-Houghton) |
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| User defined graphics (plot any performance measure vs. any variable) |
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| Optimization |
LT |
Pro/Edu |
| User defined error function |
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| Optimization of thin films |
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| Unlimited number of zoom and multiconfiguration positions |
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| Two optimization algorithms: DLS with Lagrange multiplier and active set method,
modified Levenberg-Marquardt DLS. |
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| Exact constraints ( >, <, = ) handling |
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| Autofocus for minimum spot size, wavefront or maximum MTF, coupling efficiency. |
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| Dielectric Coatings |
LT |
Pro/Edu |
| Layer editor (spreadsheet) |
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| Enter coating prescription as a formula (e.g. L(HL)^6 H0.5L) |
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| Includes material dispersion and absorption |
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| Analyze reflection and transmission vs. wavelength, incidence angle or both |
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| Analyze phase change on reflection and transmission |
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| Attach coatings directly to optical surfaces |
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| Coating optimization (Refinement) |
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| Import coating designs from "The Essential Macleod"
and "TFCalc" thin film design packages. |
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| Aperture Shapes |
LT |
Pro/Edu |
| Circular, rectangular, elliptical |
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| Polygon apertures |
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| Centered, decentered (off-axis) |
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| Central obscuration (circular, rectangular) |
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| Spiders |
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| Apodisation |
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| Vignetting |
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| Combination of arbitrary aperture shapes from basic aperture shapes
(circle, rectangle, ellipse, polygon) |
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| Number of apertures per surface |
10 |
10 |
| Check or uncheck aperture in ray trace |
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| Tolerance Analysis |
LT |
Pro/Edu |
| Sensitivity |
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| Inverse Sensitivity |
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| Statistical (Monte Carlo) analysis, in preparation |
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| ''Tolerance on anything'' |
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| Tolerance grades (ISO 10110 defaults, ''high'', ''medium'' tolerances) |
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| Optical Materials |
LT |
Pro/Edu |
| Complete glass catalogues from SCHOTT, OHARA, CORNING, HOYA, HIKARI,
SUMITA, LightPath, CARGILLE, Chinese glasses |
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| Private glass catalogue |
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| Most InfraRed materials available, exotic derivates included |
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| Direct index specification |
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| Model glasses |
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| Nearest catalogue glass |
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| Create melt glasses or new glasses |
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| Transmission, temperature, physical, mechanical and chemical data |
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| Integrated glass manager for modification of glass data |
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| Glass maps (n-n diagram, partial dispersion, Buchdahl
partials, gradient index profile, etc.) |
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| Automatic selection of materials for achromatic and apochromatic correction |
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| Surface Types |
LT |
Pro/Edu |
| Reflecting, refracting, TIR |
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| Aspheres |
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| Even power polynomial up to 18th order |
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| Odd polynomial up to 9th order |
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| Forbes Qcon and Qbfs Aspheres |
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| Mixed power polynomial up to 30th order |
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| XY polynomial up to 10th order |
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| Conic sections (parabola, ellipse, hyperbola) |
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| Cylinder (any orientation) |
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| Aspheric toroidal (asphere Y only) |
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| Anamorphic aspheric surface (biconic, potato chip) |
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| Axicon |
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| Decentered/tilted, full 3-dimensional definition without restriction on surface type. Does NOT require
dummy surfaces. |
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| Decenter/tilt of gradient coordinate system |
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| Re-definition of optical axis (e.g. "bend", "decenter and return", axis follows surface normal) |
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| Global surface references to any arbitrary preceding surface |
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| Diffraction grating (arbitrary direction of grooves) |
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| Holographic Optical Elements (HOE), diffractive (binary) elements |
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| Gradient Index (SELFOCTM, ENDOGRINTM,
GRADIUMTM, GRINTECHTM, linear axial gradient,
University of Rochester gradient, Luneberg lens, Spherical gradient,
Maxwells Fisheye) |
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| Array surfaces/elements |
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| Fresnel surface |
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| Non-sequential surfaces |
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| Birefringence |
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| Light pipes (cylindrical, tapered, sheared) |
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| Perfect lens |
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| Zernike deformation surface |
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| Spline deformation surface |
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| User Defined Surfaces (user defines own subroutines written in FORTRAN or C/C++ and links
it to the program via a DLL). |
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| User Defined Gradient (user defines own subroutines written in FORTRAN or C/C++ and links
it to the program via a DLL). |
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| Coordinate transform surface (ignores raytrace). Used to define complex opto-mechanical relations |
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| Solves (for ray incidence angle, ray height, aplanatic condition, edge thickness, etc.) |
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| Pickups (positive or negative, with offsets, on curvatures, thicknesses,
tilts/decenters and materials) |
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| Illumination |
LT |
Pro/Edu |
| Number of simultaneous sources |
|
200 |
| Flat sources (circular, elliptical, rectangular |
|
up to 200 |
| Real sources (defined by ray files) |
|
up to 200 |
| Support of ray files (e.g. provided by Osram) |
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| Support of bitmap images (BMP) for definition of sources |
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| Individually specify position and orientation of sources in 3D space |
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| Individually specify emission characteristics of flat sources |
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| Use point sources (for imaging analyses) and extended illumination sources simultaneously |
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| Report/Plot received power, intensity distribution at arbitrary target surface. |
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| Plot styles: gray-scale, false colour, pseudo-RGB colour, contour, all linear or logarithmic |
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| Macro Programming |
LT |
Pro/Edu |
| Arithmetic expressions with + - * / ** ^
operators and nested brackets ( ) |
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| Intrinsic functions (sin, cos, tan, asin, acos, atan, sinh, cosh, tanh,
sqrt, exp, log, log10, logn, besj0, besj1, besjn, abs, min, max, etc.) |
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| Lens database items (data retrieved from the optical system) |
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| Parameters passed to macros |
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| Nesting of macro files |
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| Variables |
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| User defined functions |
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| Loop constructs (DO-ENDDO, WHILE-ENDWHILE) |
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| IF-THEN-ELSE constructs |
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| Conditional processing |
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| Concatenation of strings and variables |
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| Output formatting using Fortran-style syntax |
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| Logical line handling (span statements over several lines or
have several statements in one single line) |
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| Manufacturing Support |
LT |
Pro/Edu |
| Test-plate fitting (more than 30 test plate lists) |
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| Aspheric deformation |
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| Hologram phase |
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| Tolerance Sensitivity Analysis |
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| Inverse Sensitivity Analysis |
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| Statistical (Monte-Carlo) Tolerance Analysis |
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| ISO 10110 Element drawings |
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| CAM calculations in zoom systems |
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| Example Libraries |
LT |
Pro/Edu |
| Core examples grouped in 30 categories from Array to Zoom (150 designs). |
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| Extended examples (80 designs). |
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| Arthur Cox design library (299 designs) |
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| All designs discussed in "Handbook of Optical Systems by H.Gross (Wiley-VCH)" |
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| Catalogue lens database (15 vendors, more than 8000 lenses) |
|
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| System Specification |
LT |
Pro/Edu |
| Define pupil by entrance beam radius, object numerical aperture, image numerical
aperture, working F-number or stop surface diameter. |
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| Apodization |
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| Vignetting |
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| Specify field by angle, object height or image height independently
in X- and Y-direction. |
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| Astigmatic Objects, such as in laser diodes. |
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| Wavelength specification by direct wavelength/weight pairs or by selecting
spectral distributions. Table of common wavelengths. |
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| Define conjugates by specification of object distance or magnification. |
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| Focal or afocal mode. |
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| Spectrometer mode |
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| Telecentric ray aiming |
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| Ray aiming to entrance pupil or stop surface. |
|
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| User selectable ray grid size |
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| Import, Export |
LT |
Pro/Edu |
| Export all graphics to Windows Clipboard, HPGL, DXF, EPS, WMF, CGM, BMP, PCX, PNG, SVG
and POV-Ray |
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| Export lens designs to Code V, ZEMAX, OSLO, ASAP, MODAS, ATMOS. |
|
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| Import lens designs from Code V, ZEMAX, OSLO, MODAS, ATMOS, WinLens,
Accos, Sigma-PC, Sigma2000. |
|
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| Import coating designs from "The Essential Macleod"
and "TFCalc" thin film design packages. |
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